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In Situ Multi-Wavelength Ellipsometric Control of Thickness and Composition For Bragg Reflector Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 347
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- 1995
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In situ and Ex situ Applications of Spectroscopic Ellipsometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 324 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 15
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- 1993
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Variable Angle Spectroscopic Ellipsometry Studies of HgI2
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- Journal:
- MRS Online Proceedings Library Archive / Volume 302 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 341
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- 1993
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In Situ Spectroscopic Ellipsometry for Real Time Semiconductor Growth Monitor†
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- Journal:
- MRS Online Proceedings Library Archive / Volume 216 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 459
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- 1990
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